• NanoVNA : Three papers on ResearchGate regarding the calibration techni

    From gin-pez arg@21:1/5 to All on Fri Feb 4 08:27:10 2022
    NanoVNA : Three papers on ResearchGate regarding the calibration technique
    of NanoVNA

    Hello.

    It may be of some interest to you that NanoVNA uses the calibration
    technique which is the subject of the following three papers by us now available on ResearchGate.

    Sincerely,

    73

    Nikolitsa, OE3ZGN|SV7DMC
    Petros, OE3ZZP|SV7BAX

    - - - - -

    1/3
    Building Complex Differential Error Regions

    October 2008

    Conference: ANAMET Meeting 30 At: NPL National Physical Laboratory,
    Teddington, UK Volume: Session III, Measurement uncertainty and
    traceability

    Abstract

    It is impossible to analytically estimate real uncertainties directly
    from complex differential errors - Real rectangular uncertainties are
    estimated from the orthogonal circumscribed about the complex DER -
    Real polar uncertainties are estimated from the annular sector
    circumscribed about the complex DER - The proposed method of
    uncertainty estimation, by building complex DERs, can be applied to
    any VNA calibration technique.

    https://www.researchgate.net/publication/230625680_Building_Complex_Differe ntial_Error_Regions

    2/3
    Complex DERs in Non-Zero Length Thru VNA Measurements

    October 2009

    Conference: ANAMET Meeting 32, At: National Physical Laboratory NPL, Teddington, UK Volume: Session III

    Abstract

    After "Building Complex Differential Error Regions" for two-port
    calibration VNA measurements, in 30th ANAMET meeting, we are
    considering now the case of Non-Zero Length Thru or indirect Thru with
    SLOT calibration for either case of same type/sex connectors or
    different type connectors, on both ports.

    https://www.researchgate.net/publication/230625718_Complex_DERs_in_Non-Zero _Length_Thru_VNA_Measurements

    3/3
    Measurement Uncertainty in Network Analyzers: Differential Error
    Analysis of Error Models Part 4: Non-Zero Length Through in Full
    Two-Port SLOT Calibration

    September 2016

    Journal: FunkTechnikPlus # Journal, Issue: 11, Year: 4, Pages: V1-7 to V1-2
    9

    The most accurate full two-port calibration of a VNA Vector Network
    Analyzer requires a Direct or Zero–Length Through connection. Howev
    er,
    it is not uncommon at all to have one or two cables and a DUT Device
    Under Test with incompatible connectors, either of different type or
    of the same type/sex, which enforce then the use of some kind of
    barrel or adapter. Thus, in this paper, we study these cases of
    Indirect or Non-Zero Length Through, we estimate the effects of such connections on the measurement uncertainty by using our theory of
    Differential Error Regions and Intervals DERs/DEIs, and we evaluate
    our resulting method by applying it in practice to a built two–port
    network, which was measured against frequency with a SLOT calibrated
    VNA extended by two lengthy cables.

    https://www.researchgate.net/publication/358164808_Measurement_Uncertainty_ in_Network_Analyzers_Differential_Error_Analysis_of_Error_Models_Part_4_Non -Zero_Length_Through_in_Full_Two-Port_SLOT_Calibration

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