Call for papers IWCT 2016
5th International Workshop on Combinatorial Testing
April 10th, 2016, Chicago, USA
http://iwct2016.unibg.it/
The IWCT2016 is to be held in conjunction with ICST2016 and will focus on *combinatorial testing*. The workshop welcomes academic research submissions, as well as industrial experience reports.
Submission deadline (planned)
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Submission deadline for papers is January 7th, 2016.
Author notification is February 15th, 2016
Topics
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We invite submissions of high-quality papers presenting original work on both theoretical and experimental aspects of combinatorial testing. We accept both full papers (up to 9 pages + references) and short papers (up to 4 pages + references).
Topics of interest for papers include, but are not limited to:
* Combinatorial testing workflow
o Modeling the input space for CT
o Efficient algorithms to generate t-way test suites, especially involving support of constraints
o Determination of expected system behavior for each test case
o Executing CT test suites
o Combinatorial testing based fault localization
o Implementation of CT with existing testing infrastructures
o Handling changes in test requirements
* Real-world experience in deployment of combinatorial testing
o Empirical studies and feedback from practical applications of CT
o Evaluation and ROI metrics to assess the degree of usefulness of CT
o Methodology used for test space modeling and determination of interaction coverage requirements
o Discussion of challenges and open problems in the application of CT in industrial settings
* Applicability of combinatorial testing
o Comparison and combination of CT with other dynamic verification methods
o Study of failure records to determine the kind of CT which may have detected faults
o Combinatorial testing for concurrent and real-time systems
o Cloud computing systems testing and use of combinatorial methods in cloud architecture
o Application of CT in other domains, e.g., biotech applications, mechanical engineering, security, etc.
o Combinatorial testing, feature models, and software product lines
* Combinatorial and complementing methods
o Combinatorial analysis of existing test suites
o Test plan reduction and completeness
o CT and coverage metrics - combining the two, and studying the relationship between them
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