Does anyone have any experience with implementing a traveling salesmen
solver in Labview, or interfacing with a publicly available .dll? I
would like to optimize the path of a semiconductor test tool. When
running tests that probe many devices all over the wafer, the default
pattern that we currently use is far from the most efficient. It is unnecessary that THE optimal solution is found, but a heuristic that
does better than simply going to the leftmost column that contains a
device in the test, going top to bottom, then moving right to the next column, etc. would be nice.
Some tests have very few devices, and could even be solved
brute-force. However, some tests involve 30, 50, or even up to 200
locations, and these could be estimated with a decent heuristic.
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